Atomic force microscopy (AFM) is a surface imaging technique that allows visualization and measurement a molecular level of resolution. It is used to image and manipulate atoms and structures and is one of the enabling technologies of the nanoscience boom. AFM is used in many disciplines and this is the first book to show the applications and benefits of AFM in process engineering, an area of widespread development and use. » More Details
Author(s): Richard Bowen and Nidal Hilal
Publisher: Butterworth-Heinemann / IChemE